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  • Eskişehir Technical University Journal of Science and Technology A - Applied Sciences Engineering
  • Volume:19 Issue:1
  • XRD RAMAN AND Uv-vis SPECTROSCOPICAL ANALYSIS OF NANOSTRUCTURED CdS:Li FILMS

XRD RAMAN AND Uv-vis SPECTROSCOPICAL ANALYSIS OF NANOSTRUCTURED CdS:Li FILMS

Authors : Tülay HURMA
Pages : 114-121
Doi:10.18038/aubtda.333956
View : 18 | Download : 10
Publication Date : 2018-03-31
Article Type : Research Paper
Abstract :CdS and CdS:Li films were produced my means of ultrasonic spray pyrolysis insert ignore into journalissuearticles values(USP); method by spraying on glass bases heated up to 340±5 ◦ C. LiCl in three different rates was added into the preliminary solution while producing CdS:Li films. The effect of Li on the structural and optical characteristics of the CdS film was analyzed. XDR spectra showed that the crystallization degree decreases while lithium is 15% and increases when lithium rate increases. The crystallite sizes were calculated to be in the range of 60-85 nm. SEM photographs showed that the contribution of Li changed surface appearances of films and particle size. All films exhibit the Raman peaks centered 298 and 590 cm -1 and the peak profiles are almost symmetric. The optical band gap and Urbach energy values of these films were determined. The maximum transmittance is found to be almost 80% for the visible region. LiCl which was added to the preliminary solution changed the optical characteristics of CdS film. 
Keywords : Li doped CdS film, XRD, Raman, Optical properties

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