Fingerprinting the Malfunction of Devices

Authors : Yehia ELSAYED

Pages : 79-85

View : 14 | Download : 13

Publication Date : 2007-06-01

Article Type : Research Paper

Abstract :A methodology to generate fingerprints for malfunctioning devices in a system from the design information of the system is proposed. The aim is to reduce measurement to the minimum and to the simple at the expense of more computation. A simple combined cycle is considered. A baseline of fingerprints is generated by considering the degradation of one of the efficiency parameters of a single device; one degradation at a time. Different degrees of degradation are considered at different load fractions. The load fractions considered cover the range from 1 insert ignore into journalissuearticles values(design point); to 0.4. The degrees of degradation considered cover the range from 1 insert ignore into journalissuearticles values(no degradation); to 0.6, the efficiency occurring at the considered load fraction. The needed design information is stated. Examples of fingerprints are presented in tables. Application of the base-line fingerprint methodology to existing plants in general is described. Extension to multi-degraded efficiency parameters is considered guided by the baseline fingerprints.
Keywords : off design performance of a device, device efficiency degradation, device malfunction fingerprints