EFFECT OF DIFFERENT THICKNESS AND SOLUTION CONCENTRATION ON CUS THIN FILM GROWN BY SILAR METHOD

Authors : Tuba ÇAYIR TAŞDEMİRCİ

Pages : 207-214

Doi:10.26900/jsp.3.021

View : 7 | Download : 2

Publication Date : 2019-07-28

Article Type : Research Paper

Abstract :In this study, CuS thin films were successfully coated on glass substrate at room temperature using successive ionic layer absorption and reaction insert ignore into journalissuearticles values(SILAR); method. Thickness and solution concentration parameters which are important in SILAR management were used to obtain CuS thin films. X-Ray diffraction spectroscopy insert ignore into journalissuearticles values(XRD);, Scanning Electron Microscopy insert ignore into journalissuearticles values(SEM); / Energy Spread X-ray Spectroscopy insert ignore into journalissuearticles values(EDX); were used to examine the changes in thickness and solution concentration in the structure of CuS thin films. Because of the investigations, it was found that CuS thin films improved both the number of cycles and the concentration of the solution and that the crystal structure improved and the SEM / EDX results supported this result.
Keywords : CuS, SILAR, deposition, thin film