Single pixel scanning based millimeter wave imaging

Authors : Ziaoulrahman SEDIQI, Asaf Behzat ŞAHİN

Pages : 14-18

Doi:10.31015/jaefs.2020.1.3

View : 45 | Download : 12

Publication Date : 2020-03-15

Article Type : Research Paper

Abstract :A food processing line is comparatively vulnerable to contaminants, whether through inattentive workers and employees or from the processing machines made largely out of steel or from raw materials that are contaminated themselves. Any of these risks can affect quality resulting in poor hygiene or even can put customer health in danger. Millimeter-wave imaging plays a significant role in many fields such as security inspection and medical diagnostics. Moreover, millimeter wave instruments are useful in detecting objects behind and inside visibly opaque barriers such as, concrete walls and plastic boxes. We describe a millimeter wave imaging system that uses a one-dimensional detector in combination with a single pixel mask in order to acquire two-dimensional images out of buried objects inside a bread. Our system can be used to detect metals and salty substances for bread quality control and defect detection. The system uses 60 GHz center frequency to image the target in transmission mode which utilizes a heterodyne sub-harmonic receiver placed in a bi-static configuration
Keywords : Single pixel, Millimeter wave, Non intrusive quality control, foreign object defect detection

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