Learning Optimized Patterns of Software Vulnerabilities with the Clock-Work Memory Mechanism

Home Page
About
Submit A Journal
Submit A Conference
Submit Paper/Book
- Submit a Preprint
- Submit a Book
Contact

Avrupa Bilim ve Teknoloji Dergisi
Issue:41
Learning Optimized Patterns of Software Vulnerabilities with the Clock-Work Memory Mechanism

Learning Optimized Patterns of Software Vulnerabilities with the Clock-Work Memory Mechanism

Pages : 156-165

View : 50 | Download : 27

Publication Date : 2022-11-30

Article Type : Research Paper

Abstract :It is possible to better provide the security of the codebase and keep testing efforts at a minimum level by detecting vulnerable codes early in the course of software development. We assume that nature-inspired metaheuristic optimization algorithms can obtain “optimized patterns” from vulnerabilities created in an artificial manner. This study aims to use nature-inspired optimization algorithms combining heterogeneous data sources with the objective of learning optimized representations of vulnerable source codes. The chosen vulnerability-relevant data sources are cross-domain, involving historical vulnerability data from variable software projects and data from the Software Assurance Reference Database insert ignore into journalissuearticles values(SARD); comprising vulnerability examples. The main purpose of this paper is to outline the state-of-the-art and to analyze and discuss open challenges with regard to the most relevant areas in the field of bio-inspired optimization based on the representation of software vulnerability. Empirical research has demonstrated that the optimized representations produced by the suggested nature-inspired optimization algorithms are feasible and efficient and can be transferred for real-world vulnerability detection.
Keywords : Feature Selection, Nature inspired Algorithm, Optimization, Representation learning, Software Vulnerability

ORIGINAL ARTICLE URL

* There may have been changes in the journal, article,conference, book, preprint etc. informations. Therefore, it would be appropriate to follow the information on the official page of the source. The information here is shared for informational purposes. IAD is not responsible for incorrect or missing information.