IAD Index of Academic Documents
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  • Turkish Journal of Electrical Engineering and Computer Science
  • Volume:17 Issue:3

Construction and applications of the Dirichlet-to-Neumann operator in transmission line modeling

Thomas DEMEESTER, Daniël De ZUTTER
Publication date : 0000-00-00

Variance and kurtosis-based characterization of resonances in stochastic transmission lines: local versus global random geometries

Ousmane Oumar SY, Martijn C Van BEURDEN
Publication date : 0000-00-00

Weak penetration and radiation through apertures in conducting bodies of revolution

Korkut YEĞİN
Publication date : 0000-00-00

Experimantal characterization and equivalent circuit extraction of nanowires for signal integrity applications

Gicelio ANTONINI, Marc Di CLERICO, Antonio ORLANDI
Publication date : 0000-00-00

Conductive EMI noise measurement for switched reluctance drive

Hao CHEN, Xiaohui QIU, Yang ZHAO
Publication date : 0000-00-00

EMC education at the University of Technology Zurich

Gökhan APAYDIN, Niyazi ARI
Publication date : 0000-00-00

Electromagnetic compatibility engineering education: problems, challenges and perspectives

Levent SEVGİ
Publication date : 0000-00-00

Two dimensional EBG structures for multiband noise mitigation

Antonio Ciccomancini SCOGNA, Antonio ORLANDI
Publication date : 0000-00-00

Development of a magnetic field model and insertion~into a commercial electromagnetic simulator

Priscila FERNANDEZ LOPEZ, Christian ARCAMBAL, Yolanda VIVES GILABERT
Publication date : 0000-00-00

Modeling and calculation of electromagnetic field in the surroundings of a large power transformer

Leonardo STRAC, Franjo KELEMEN, Damir ZARKO
Publication date : 0000-00-00

Electromagnetic radiation from multilayer printed circuit boards: a 3D FDTD-based virtual emission predictor

Gonca ÇAKIR, Mustafa ÇAKIR, Levent SEVGİ
Publication date : 0000-00-00

VLSI-cell placement technique for Architecture of Field Programmable Gate Array (FPGA) design

Avnesh VERMA, Sunil DHINGRA, M K SONI
Publication date : 0000-00-00

New ESD standard and influence on test equipment requirements

Nicholas WRIGHT
Publication date : 0000-00-00

* There may have been changes in the journal, article,conference, book, preprint etc. informations. Therefore, it would be appropriate to follow the information on the official page of the source. The information here is shared for informational purposes. IAD is not responsible for incorrect or missing information.


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