Electron Spectroscopy for Material Characterization

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Turkish Journal of Chemistry
Volume:22 Issue:4
Electron Spectroscopy for Material Characterization

Electron Spectroscopy for Material Characterization

Authors : Şefik SÜZER

Pages : 309-320

View : 12 | Download : 14

Publication Date : 0000-00-00

Article Type : Research Paper

Abstract :Basic principles of the two electron spectroscopic techniques, the x-ray photoelectron spectroscopy, XPS, and the Auger electron spectroscopy, AES, are given. Their utilization in material characterization are introduced through examples with application of these techniques to various surface related problems.
Keywords : Turk J Chem, 22, 1998, 309 320 Turk J Chem, vol 22, iss 4

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