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  • Turkish Journal of Physics
  • Volume:29 Issue:2
  • Microstructure Characterization of ZnFe2−xMxO4 (M = Bi, Y and x = 0.1, 0.2) Ferrites by the Rietveld...

Microstructure Characterization of ZnFe2−xMxO4 (M = Bi, Y and x = 0.1, 0.2) Ferrites by the Rietveld Refinement

Authors : Mansour ALHAJ
Pages : 85-90
View : 12 | Download : 6
Publication Date : 0000-00-00
Article Type : Research Paper
Abstract :The microstructure of the ferrites was analyzed by the Reitveld refinement method. The Bi-containing ferrites revealed a decrease in the lattice parameter as the Bi3+ concentration is increased, due to the distortion of the ferrite lattice. There was a minor distortion in the ZnFe1.9Y0.1O4 ferrite lattice. A minor yttrium oxide phase coexisted with the ZnFe1.8Y0.2O4 spinel phase.
Keywords : Ferrites, X ray diffraction, lattice parameter, paramagnetic, magnetization

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