Computational Study for the Structural Change of the System CdTe1-x Sx Thin Film

Authors : Emad Khdayer ALSHAKARCHI

Pages : 355-362

View : 16 | Download : 5

Publication Date : 0000-00-00

Article Type : Research Paper

Abstract :Polycrystalline thin film of the graded system CdTe1-xSx for x=0,0.1,\ldots,1 are prepared by using thermal evaporation technique deposited on the glass substrate with an average thickness 3000 Å for each individual value of x . XRD technique is used with the aid of a computational program to study the phase change from cubic zinc blend structure to hexagonal wurtzite with an inversion point related to the x-value. It is found that x=0.1 gives us an inversion point in the structural change from cubic to hexagonal phase.
Keywords : Thin films, ternary compound, structural behaviour and miller indices