Design & modeling a novel Atomic Force Microscope (AFM) for detect roughness in turning machining

Home Page
About
Submit A Journal
Submit A Conference
Submit Paper/Book
- Submit a Preprint
- Submit a Book
Contact

Cumhuriyet Üniversitesi Fen-Edebiyat Fakültesi Fen Bilimleri Dergisi
Volume:36 Issue:3
Design & modeling a novel Atomic Force Microscope (AFM) for detect roughness in turning machining

Design & modeling a novel Atomic Force Microscope (AFM) for detect roughness in turning machining

Authors : Omid GHAHGHAEİ, Saeed MALEKZADEH, Hamed NAEİMY

Pages : 1-10

View : 48 | Download : 15

Publication Date : 2015-05-13

Article Type : Review Paper

Abstract :Abstract. In this paper we design and modeling a novel AFM (Atomic Force Microscope) that use it in turning machining. We know that work piece roughness is very essential part in final product in every machining method specially in turning. In this case we want to know availability of using AFM in turning. So at first designed a kind of AFM with cantilever beam, piezoelectric and piezoresistance. After that we should modeling this design in our situation, for these we define some surface that may be happen in machining. So know modeled our design for sample surface. At the end of project a P control method has been used for controlling our processing.
Keywords : Atomic Force Microscope, turning machining, roughness, AFM control, cantilever beam

ORIGINAL ARTICLE URL

* There may have been changes in the journal, article,conference, book, preprint etc. informations. Therefore, it would be appropriate to follow the information on the official page of the source. The information here is shared for informational purposes. IAD is not responsible for incorrect or missing information.